Digital Library

검색어: " keyword: Program Testing" (3)
1. Automated Black-Box Test Case Generation for MC/DC with SAT
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 16D, No.6, pp.911-920, June 2009
10.3745/KIPSTD.2009.16D.6.911
KIPS Journal D (2001 ~ 2012)
2. Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 16D, No.3, pp.371-380, March 2009
10.3745/KIPSTD.2009.16D.3.371
KIPS Journal D (2001 ~ 2012)
3. An Alloy Specification Based Automated Test Data Generation Technique
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 14D, No.2, pp.191-202, February 2007
10.3745/KIPSTD.2007.14D.2.191
KIPS Journal D (2001 ~ 2012)
1

Indexing


All publications of KTCCS and KTSDE are indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

doi

EBSCO

Google

crosscheck_it_trans

NRF

NRF


KTCCS and KTSDE are also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).