Digital Library

검색어: " author: In Sang Chung" (7)
1. Automated Test Data Generation for Dynamic Branch Coverage
In Sang Chung, KIPS Transactions on Software and Data Engineering, Vol. 2, No.7, pp.451-460, July 2013
10.3745/KTSDE.2013.2.7.451
KIPS Transactions on Software and Data Engineering
2. An automation method for GUI test using a UIA Library
Chang Min Choi, In Sang Chung, Hyeon Soo Kim, KIPS Journal D (2001 ~ 2012) , Vol. 18D, No.5, pp.343-356, May 2011
10.3745/KIPSTD.2011.18D.5.343
KIPS Journal D (2001 ~ 2012)
3. Detection of Potential Memory Access Errors based on Assembly Codes
Hyun Soo Kim, Byeong Man Kim, Hyun Seop Bae, In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 18D, No.1, pp.35-44, January 2011
10.3745/KIPSTD.2011.18D.1.035
KIPS Journal D (2001 ~ 2012)
4. Automated Test Data Generation for Testing Programs with Multi-Level Stack-directed Pointers
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 17D, No.4, pp.297-310, April 2010
10.3745/KIPSTD.2010.17D.4.297
KIPS Journal D (2001 ~ 2012)
5. Automated Black-Box Test Case Generation for MC/DC with SAT
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 16D, No.6, pp.911-920, June 2009
10.3745/KIPSTD.2009.16D.6.911
KIPS Journal D (2001 ~ 2012)
6. Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 16D, No.3, pp.371-380, March 2009
10.3745/KIPSTD.2009.16D.3.371
KIPS Journal D (2001 ~ 2012)
7. An Alloy Specification Based Automated Test Data Generation Technique
In Sang Chung, KIPS Journal D (2001 ~ 2012) , Vol. 14D, No.2, pp.191-202, February 2007
10.3745/KIPSTD.2007.14D.2.191
KIPS Journal D (2001 ~ 2012)
1

Indexing


All publications of KTCCS and KTSDE are indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

doi

EBSCO

Google

crosscheck_it_trans

NRF

NRF


KTCCS and KTSDE are also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).